- See the characteristics of reflections in both time and frequency simultaneously through the application of spectrographic analysis.
- High quality spectrogram image generation through “High Definition” signal processing.
- Eliminate the distortion inherent in Frequency-Gated-By-Time processing by selecting signal responses from any fragment of time-frequency space using powerful, easy to use tools.
- Determine equivalent circuit models for discontinuities and loads using post-processing of spectrograms.
- De-embed modeled discontinuities to remove unwanted aspects of measurements.
- De-embed 1- and 2-port devices using Time Domain Substitution
- Works with S1P, S2P, S3P, and S4P files
- Compatible with Agilent™ PNA-X, Anritsu™ 37xxxD, Agilent™ ENA, and Rohde & Schwarz™ ZVB
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